Notes for Microelectronics Fabrication
Overview & Synopsis
This note covers the following topics:
Semiconductor and Solid State Physics, Crystal Structure and Growth, Defects in
Semiconductors and Internal Gettering, Silicon Dioxide and Thermal Oxidation,
Current-Voltage Analysis, Thickness Measurement, Ultra Thin Oxides, Impurity
Diffusion, Sheet Resistance and Diffusion Profiles, Electrical Characteristics
of pn-Junctions, Atomic Processes of Diffusion, Ion Implantation, Implanted and
Diffused Profiles.
Indexed from repository: FreeBookCentre
(
freebookcentre.net)
Document Information
| Document Title | Notes for Microelectronics Fabrication |
|---|---|
| Author / Organization | David R. Evans |
| Categories | Microelectronics |
| Resource Verification | Listed PDF (Verification Pending) |
| Original Host Website |
FreeBookCentre
(freebookcentre.net)
|
| File Format | application/pdf (Portable Document Format) |
| Page Count | 242 pages |
| Language | EN |
| Catalog ID | DOC-309570 |
| Original Source Link | Visit Source Page on freebookcentre.net » |