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Circuit-level simulation of TID and thermal regeneration effects on 28nm FDSOI technology
Author / Organization: Alejandro Ureña-Acuña, Jean-Marc Armani
| File Format | PDF (Portable Document Format) |
|---|---|
| Publication Year | 2024 |
| Source Host |
HAL Open Science
(hal.science)
|
| License / Terms | Open Access / Creative Commons |
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