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Static and low frequency noise characterization in standard and rotated UTBOX nMOSFETs

Author / Organization: Bogdan Cretu, E. Simoen, Jean-Marc Routoure, Régis Carin, M. Aoulaiche, Cor Claeys

File Format PDF (Portable Document Format)
Publication Year 2015
Source Host HAL Open Science (hal.science)
License / Terms Open Access / Creative Commons

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