SAXS study of coated porous silicas
Overview & Synopsis
The small-angle x-ray intensities scattered (SAXS) by four reversed phase silica (RPS) samples are analyzed. The RPS's have been obtained by coating two different porous silica supports with dimethyloctyl- and with dimethyloctadecyl-(chloro)silane. From the observed intensities it is possible to estimate the mean electron-densities of the films as well as the mean silica-surface per coating molecule.
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hal.science)
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Document Information
| Document Title | SAXS study of coated porous silicas |
|---|---|
| Author / Organization | A. Benedetti, S. Ciccariello, F. Pinna, G. Strukul |
| Subject & Discipline | Multidisciplinary Academic Open Research |
| Categories | Science & Mathematics |
| Publication Year | 1993 |
| License / Rights | Open Access / Creative Commons |
| Resource Verification | Listed PDF (Verification Pending) |
| Original Host Website |
HAL Open Science
(hal.science)
|
| File Format | application/pdf (Portable Document Format) |
| Language | EN |
| Catalog ID | DOC-76874 |
| Original Source Link | Visit Source Page on hal.science » |