Optical characterization of CdTe/ZnTe semiconductor wires and dots
Overview & Synopsis
Arrays of wires and dots have been fabricated by electron beam lithography and Ar+ ion beam etching from CdTe/ZnTe quantum wells. Low temperature photoluminescence coming out from these structures is still observed for the smallest wires (40 nm) whereas for the dots, the detection limit occurs for lateral dimensions of 100 nm.
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Document Information
| Document Title | Optical characterization of CdTe/ZnTe semiconductor wires and dots |
|---|---|
| Author / Organization | C. Gourgon, B. Eriksson, L. Dang, H. Mariette, Christophe Vieu |
| Subject & Discipline | Multidisciplinary Academic Open Research |
| Categories | Science & Mathematics |
| Publication Year | 1993 |
| License / Rights | Open Access / Creative Commons |
| Resource Verification | Listed PDF (Verification Pending) |
| Original Host Website |
HAL Open Science
(hal.science)
|
| File Format | application/pdf (Portable Document Format) |
| Language | EN |
| Catalog ID | DOC-72788 |
| Original Source Link | Visit Source Page on hal.science » |