Device Reliability to Circuit Qualification: Insights and Challenges
Overview & Synopsis
Aging phenomena are first evidenced at device level to cell level considering a precise knowledge of the leading degradation mechanisms and interactions useful for processing optimization focusing performance vs. reliability requirements. Digital to analog circuits are then studied for product qualification based on the former results that needs specific methodologies adapted case by case with mission profile and the correlation between sensing parameter, accelerating factors for lifetime margin. This represents huge challenges for operational lifetime determination, considering top down and bottom up consistencies for relevant product qualification.
Indexed from repository: HAL Open Science
(
hal.science)
Keyboard Shortcuts:
← / → for pages • + / - for zoom • 0 to fit width
Powered by Mozilla PDF.js v3.11
Document Information
| Document Title | Device Reliability to Circuit Qualification: Insights and Challenges |
|---|---|
| Author / Organization | F. Cacho, Alain Bravaix, T. Garba Seybou, H. Pitard, X. Federspiel, T. Kumar, F. Giner, A. Michard, D. Celeste, B. Miller, V. Dhanda, A. Varshney, V. Tripathi, J. Kumar |
| Subject & Discipline | Multidisciplinary Academic Open Research |
| Categories | Science & Mathematics |
| Publication Year | 2022 |
| License / Rights | Open Access / Creative Commons |
| Resource Verification | Listed PDF (Verification Pending) |
| Original Host Website |
HAL Open Science
(hal.science)
|
| File Format | application/pdf (Portable Document Format) |
| Language | EN |
| Catalog ID | DOC-41175 |
| Original Source Link | Visit Source Page on hal.science » |