Home » Authors » F. Cacho, Alain Bravaix, T. Garba Seybou, H. Pitard, X. Federspiel, T. Kumar, F. Giner, A. Michard, D. Celeste, B. Miller, V. Dhanda, A. Varshney, V. Tripathi, J. Kumar

F. Cacho, Alain Bravaix, T. Garba Seybou, H. Pitard, X. Federspiel, T. Kumar, F. Giner, A. Michard, D. Celeste, B. Miller, V. Dhanda, A. Varshney, V. Tripathi, J. Kumar

Public reference bibliography and cataloged PDF materials authored or published by F. Cacho, Alain Bravaix, T. Garba Seybou, H. Pitard, X. Federspiel, T. Kumar, F. Giner, A. Michard, D. Celeste, B. Miller, V. Dhanda, A. Varshney, V. Tripathi, J. Kumar.

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Device Reliability to Circuit Qualification: Insights and Challenges

Year: 2022 • Source: hal.science • Listed PDF

Aging phenomena are first evidenced at device level to cell level considering a precise knowledge of the leading degradation mechanisms and interactions useful for processing optimization focusing performance vs. reliabi...