High quality factor of AlN microdisks embedding GaN quantum dots
Overview & Synopsis
We report the observation of high quality (Q) factor whispering gallery modes for GaN/AlN quantum dot based microdisks. Room temperature photoluminescence measurements show a large number of high Q modes on the whole PL spectral range. For the first time we report Q values up to 6000 for nitride based cavities. We attribute this improvement of the Q factor to the etching quality and to the relatively low cavity loss by inserting dots into the microdisks. The uniformity of the resonant modes with respect to a wide range of energies allows us to identify the different radial mode families.
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Document Information
| Document Title | High quality factor of AlN microdisks embedding GaN quantum dots |
|---|---|
| Author / Organization | Meletios Mexis, Sylvain Sergent, Thierry Guillet, Christelle Brimont, Thierry Bretagnon, Bernard Gil, Fabrice Semond, Mathieu Leroux, Delphine Néel, Sylvain David, X. Checoury, Philippe Boucaud |
| Subject & Discipline | Multidisciplinary Academic Open Research |
| Categories | Science & Mathematics |
| Publication Year | 2010 |
| License / Rights | Open Access / Creative Commons |
| Resource Verification | Listed PDF (Verification Pending) |
| Original Host Website |
HAL Open Science
(hal.science)
|
| File Format | application/pdf (Portable Document Format) |
| Language | EN |
| Catalog ID | DOC-86752 |
| Original Source Link | Visit Source Page on hal.science » |