Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization
Overview & Synopsis
This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, including scientists, engineers, graduate students, postdoctoral fellows, and scientific professionals working in specialized fields such as AFM, photovoltaics, 2D materials, carbon nanotubes, nanomaterials, and Raman spectroscopy.
Indexed from repository: Directory of Open Access Books
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www.doabooks.org)
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Document Information
| Document Title | Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization |
|---|---|
| Author / Organization | DOAB Contributor |
| Subject & Discipline | Condensed matter physics (liquid state & solid state physics) |
| Categories | Open Access Books |
| Publication Year | 2022 |
| License / Rights | Open Access / Creative Commons |
| Resource Verification | Listed PDF (Verification Pending) |
| Original Host Website |
Directory of Open Access Books
(www.doabooks.org)
|
| File Format | application/pdf (Portable Document Format) |
| Language | EN |
| Catalog ID | DOC-33791 |
| Original Source Link | Visit Source Page on www.doabooks.org » |