Spectrally resolved x-ray beam induced current in a single InGaP nanowire
Overview & Synopsis
We demonstrate x-ray absorption fine structure spectroscopy (XAFS) detected by x-ray beam induced current (XBIC) in single n(+)i-n(+) doped nanowire devices. Spatial scans with the 65 nm diameter beam show a peak of the XBIC signal in the middle segment of the nanowire. The XBIC and the x-ray fluorescence signals were detected simultaneously as a function of the excitation energy near the Ga K absorption edge at 10.37 keV. The spectra show similar oscillations around the edge, which shows that the XBIC is limited by the primary absorption. Our results reveal the feasibility of the XBIC detection mode for the XAFS investigation in nanostructured devices.
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Document Information
| Document Title | Spectrally resolved x-ray beam induced current in a single InGaP nanowire |
|---|---|
| Author / Organization | Lert Chayanun, Vilgaile Dagyte, Andrea Troian, Damien Salomon, Magnus Borgstrom, Jesper Wallentin |
| Subject & Discipline | Multidisciplinary Academic Open Research |
| Categories | Science & Mathematics |
| Publication Year | 2018 |
| License / Rights | Open Access / Creative Commons |
| Resource Verification | Listed PDF (Verification Pending) |
| Original Host Website |
HAL Open Science
(hal.science)
|
| File Format | application/pdf (Portable Document Format) |
| Language | EN |
| Catalog ID | DOC-28747 |
| Original Source Link | Visit Source Page on hal.science » |