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Strain-induced disorder from Schottky gates on high mobility 2DEGs
Sambit Mohapatra, Lukas Berg, Jean-Baptiste Cuvellier, Yan Sun, Abdelhanin Aassime, Alan Durnez, Antonella Cavanna, Dominique Mailly, Ulf Gennser

Strain-induced disorder from Schottky gates on high mobility 2DEGs

Science & Mathematics Published 2026 Verification Pending

Overview & Synopsis

Electrostatic gates on two-dimensional electron gases (2DEGs) in GaAs/AlGaAs heterostructures are essential for numerous studies of correlation driven phenomena, many performed within the fractional quantum Hall effect. However, the most commonly used type of gates, the metallic Schottky gate, has the propensity to adversely impact the electron mobility and suppress the fractional quantum Hall states. Here we demonstrate through commensurability oscillations under specially designed nanostructured superlattice gates, that strain effects are responsible for the mobility reduction. The experimental results agree well with COMSOL Multiphysics simulations. In a regular, unpatterned gate the disordered, granular nature of the metal film fills the same role as the superlattice in creating a strain field penetrating down to the 2DEG, as we show with a simplified model. These results will help in understanding, improving and finding novel methods to reduce strain-induced disorder in gated high-mobility 2DEGs.

Indexed from repository: arXiv (arxiv.org)
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Document Information

Document Title Strain-induced disorder from Schottky gates on high mobility 2DEGs
Author / Organization Sambit Mohapatra, Lukas Berg, Jean-Baptiste Cuvellier, Yan Sun, Abdelhanin Aassime, Alan Durnez, Antonella Cavanna, Dominique Mailly, Ulf Gennser
Subject & Discipline cond-mat.mes-hall
Categories Science & Mathematics
Publication Year 2026
License / Rights arXiv Open Access / Creative Commons
Resource Verification Listed PDF (Verification Pending)
Original Host Website arXiv (arxiv.org)
File Format application/pdf (Portable Document Format)
Language EN
Catalog ID DOC-272987
Original Source Link Visit Source Page on arxiv.org »