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Binder migration across film consolidation and pore emptying in electrode drying: a continuous model validated against drying-rate, thickness, and schedule experiments
Author / Organization: Younghwan Joo, Sanghyun Oh, Sung-il Kim
| File Format | PDF (Portable Document Format) |
|---|---|
| Publication Year | 2026 |
| Source Host |
arXiv
(arxiv.org)
|
| License / Terms | arXiv Open Access / Creative Commons |
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