Quantification of non-bridging oxygens in silicates using X-ray Raman scattering

Overview & Synopsis

Detecting and quantifying non-bridging oxygen (NBO) atoms is of particular interest for understanding the physical properties of melts or compressed materials, and requires an unequivocal spectral signature usable during in-situ measurements. In this paper, we evidence a low-energy feature of NBO in lithium silicate crystals using X-ray Raman scattering (XRS) spectroscopy around the energy losses of the oxygen K edge. A specific peak at 534-535 eV in the edge onset is unequivocally attributed to the presence of NBO. Its intensity is used to quantify NBO in lithium silicate glasses. A similar feature at low energy has also been evidenced in Na 2 SiO 3 and MgSiO 3 , generalizing the method to other alkali and alkali-earth silicates. This non-destructive method of NBO quantification, which is based on an X-ray inelastic scattering technique, can be extended to other spectroscopies such as electron-energy loss spectroscopy, soft x-ray absorption spectroscopy at the oxygen K edge.