The angular dislocation parallel to a free surface. Application to a (111)Si low angle twist boundary
Overview & Synopsis
The elastic displacement field of a sharply angular dislocation with its two legs parallel to a planar free surface is given in a practical analytical form. Its expression gives access, in transmission electron microscopy (TEM), to computed images of numerous interacting dislocations all located at a distance h close to the free surface. As an application, this field is used repeatedly to study, in dark-field TEM and a g(3g) diffraction mode with g{220}, the contrast of dissociated triple nodes of a low-angle twist boundary in silicon extended over a (111) plane. It is shown that free surface elastic effects can influence the contrasts of some 30° partials if h is at nanometer scale.
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Document Information
| Document Title | The angular dislocation parallel to a free surface. Application to a (111)Si low angle twist boundary |
|---|---|
| Author / Organization | Salem Neily, Sami Youssef, Frank Fournel, R. Bonnet |
| Subject & Discipline | Multidisciplinary Academic Open Research |
| Categories | Science & Mathematics |
| Publication Year | 2011 |
| License / Rights | Open Access / Creative Commons |
| Resource Verification | Listed PDF (Verification Pending) |
| Original Host Website |
HAL Open Science
(hal.science)
|
| File Format | application/pdf (Portable Document Format) |
| Language | EN |
| Catalog ID | DOC-239662 |
| Original Source Link | Visit Source Page on hal.science » |