A Two-Scale Microfacet Reflectance Model Combining Reflection and Diffraction
Overview & Synopsis
Adequate reflectance models are essential for the production of photorealistic images. Microfacet reflectance models predict the appearance of a material at the macroscopic level based on microscopic surface details. They provide a good match with measured reflectance in some cases, but not always. This discrepancy between the behavior predicted by microfacet models and the observed behavior has puzzled researchers for a long time. In this paper, we show that diffraction effects in the micro-geometry provide a plausible explanation. We describe a two-scale reflectance model, separating between geometry details much larger than wavelength and those of size comparable to wavelength. The former model results in the standard Cook-Torrance model. The latter model is responsible for diffraction effects. Diffraction effects at the smaller scale are convolved by the micro-geometry normal distribution. The resulting two-scale model provides a very good approximation to measured reflectances.
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Document Information
| Document Title | A Two-Scale Microfacet Reflectance Model Combining Reflection and Diffraction |
|---|---|
| Author / Organization | Nicolas Holzschuch, Romain Pacanowski |
| Subject & Discipline | Multidisciplinary Academic Open Research |
| Categories | Science & Mathematics |
| Publication Year | 2017 |
| License / Rights | Open Access / Creative Commons |
| Resource Verification | Listed PDF (Verification Pending) |
| Original Host Website |
HAL Open Science
(hal.science)
|
| File Format | application/pdf (Portable Document Format) |
| Language | EN |
| Catalog ID | DOC-205041 |
| Original Source Link | Visit Source Page on hal.science » |