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Development and application of reference and routine analytical methods providing SI-traceable results for the determination of technology-critical elements in PCB from WEEE
Author / Organization: Giancarlo d'Agostino, Marcus Oelze, Jochen Vogl, Jean-Philippe Ghestem, Nicolas Lafaurie, Ole Klein, Daniel Pröfrock, Marco Di Luzio, Luigi Bergamaschi, Radojko Jaćimović, Caroline Oster, Johanna Irrgeher, Shaun T Lancaster, Anna Walch, Anita Röthke, Lena Michaliszyn, Axel Pramann, Olaf Rienitz, Timo Sara-Aho, Oktay Cankur, Derya Kutan, Johanna Noireaux
| File Format | PDF (Portable Document Format) |
|---|---|
| Publication Year | 2024 |
| Source Host |
HAL Open Science
(hal.science)
|
| License / Terms | Open Access / Creative Commons |
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