MISORIENTATION DEPENDENCE OF DIFFUSION INDUCED GRAIN BOUNDARY MIGRATION (DIGM) IN ORIENTED Cu (Zn) BICRYSTALS
Overview & Synopsis
Diffusion induced grain boundary migration (DIGM) has been studied in the Cu(Zn) system using Cu bicrystals with initially symmetrical tilt grain boundaries (GBs) of the {011} type produced by diffusion bonding. The misorientation has been varied systematically over the range from 10.1 to 171.9°. Measurements of the GB velocity showed it to have a strong dependence on the misorientation angle. The morphology of DIGM has been studied by optical microscopy. As a special morphological phenomenon, faceting has been investigated at a symmetrical Σ 19a/26.52° {011} GB.
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Document Information
| Document Title | MISORIENTATION DEPENDENCE OF DIFFUSION INDUCED GRAIN BOUNDARY MIGRATION (DIGM) IN ORIENTED Cu (Zn) BICRYSTALS |
|---|---|
| Author / Organization | B. Giakupian, R. Schmelzle, W. Gust, R. Fournelle |
| Subject & Discipline | Multidisciplinary Academic Open Research |
| Categories | Science & Mathematics |
| Publication Year | 1990 |
| License / Rights | Open Access / Creative Commons |
| Resource Verification | Listed PDF (Verification Pending) |
| Original Host Website |
HAL Open Science
(hal.science)
|
| File Format | application/pdf (Portable Document Format) |
| Language | EN |
| Catalog ID | DOC-180913 |
| Original Source Link | Visit Source Page on hal.science » |