Caractérisation des circuits intégrés micro-onde à base d'Arséniure de Gallium par sondage électro-optique utilisant un faisceau laser continu

Overview & Synopsis

Recently, the number of microwave applications increased with the evolution of new telecommunication techniques and hence the use of Microwave Monolithic Integrated Circuits (MMIC's) made of Gallium Arsenide (GaAs). For the further development of MMIC's, it is important to have characterization tools available to examine the processes inside the Integrated Circuit (IC). In this paper, we present the theory and the technics of the electro-optic probing technique used in our laboratory to characterize MMIC's. The main goal was to realize a "simple" and "cheap" probing tool using standard fiber equipment and a microwave network analyzer.