New Schemes for Self-Testing RAM
Overview & Synopsis
This paper gives an overview of a new technique, named pseudo-ring testing (PRT). PRT can be applied for testing wide type of random access memories (RAM): bit- or word-oriented and single- or dual-port RAM's. An essential particularity of the proposed methodology is the emulation of a linear automaton over Galois field by memory own components.
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hal.science)
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Document Information
| Document Title | New Schemes for Self-Testing RAM |
|---|---|
| Author / Organization | Gh. Bodean, D. Bodean, A. Labunetz |
| Subject & Discipline | Multidisciplinary Academic Open Research |
| Categories | Science & Mathematics |
| Publication Year | 2005 |
| License / Rights | Open Access / Creative Commons |
| Resource Verification | Listed PDF (Verification Pending) |
| Original Host Website |
HAL Open Science
(hal.science)
|
| File Format | application/pdf (Portable Document Format) |
| Language | EN |
| Catalog ID | DOC-156663 |
| Original Source Link | Visit Source Page on hal.science » |