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Reliability, power losses and volume comparison for isolated DC/DC converters using Si and GaN devices
Author / Organization: Kelly Ribeiro de Faria, Tanguy Phulpin, Daniel Sadarnac, Charif Karimi, Larbi Bendani
| File Format | PDF (Portable Document Format) |
|---|---|
| Publication Year | 2018 |
| Source Host |
HAL Open Science
(hal.science)
|
| License / Terms | Open Access / Creative Commons |
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