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Analysis of Bridge Defects in STT-MRAM Cells Under Process Variations and a Robust DFT Technique for Their Detection

Author / Organization: Victor Champac, Andres Gomez, Freddy Forero, Kaushik Roy

File Format PDF (Portable Document Format)
Publication Year 2018
Source Host HAL Open Science (hal.science)
License / Terms Open Access / Creative Commons

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