Efficient sensitivity analysis of the EMC BCI test
Overview & Synopsis
The BCI (Bulk Current Injection) test in electromagnetic compatibility is a reference scenario widely used in industry for the conducted immunity evaluation of electronic equipment. Quantifying the influence of all geometrical parameters is a key challenge. This work shows that a fast sensitivity analysis can be performed with the use of a small number of sampling data thanks to metamodelling used to compute Sobol indices. The interest of the approach is demonstrated through a susceptibility analysis involving a realistic multi-conductors line under probe.
Indexed from repository: HAL Open Science
(
hal.science)
Keyboard Shortcuts:
← / → for pages • + / - for zoom • 0 to fit width
Powered by Mozilla PDF.js v3.11
Document Information
| Document Title | Efficient sensitivity analysis of the EMC BCI test |
|---|---|
| Author / Organization | Etse Kokouvi, Lionel Pichon, Mohamed Touré, Mariem Ksouri |
| Subject & Discipline | Multidisciplinary Academic Open Research |
| Categories | Science & Mathematics |
| Publication Year | 2021 |
| License / Rights | Open Access / Creative Commons |
| Resource Verification | Listed PDF (Verification Pending) |
| Original Host Website |
HAL Open Science
(hal.science)
|
| File Format | application/pdf (Portable Document Format) |
| Language | EN |
| Catalog ID | DOC-146964 |
| Original Source Link | Visit Source Page on hal.science » |