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Failure analysis based on microvoid growth for sheet metal during uniaxial and biaxial tensile tests
Fethi Abbassi, Sebastien Mistou, Ali Zghal

Failure analysis based on microvoid growth for sheet metal during uniaxial and biaxial tensile tests

Science & Mathematics Published 2013 Verification Pending

Overview & Synopsis

The aim of the presented investigations is to perform an analysis of fracture and instability during simple and complex load testing by addressing the influence of ductile damage evolution in necking processes. In this context, an improved experimental methodology was developed and successfully used to evaluate localization of deformation during uniaxial and biaxial tensile tests. The biaxial tensile tests are carried out using cruciform specimen loaded using a biaxial testing machine. In this experimental investigation, Stereo-Image Correlation technique has is used to produce the heterogeneous deformations map within the specimen surface. Scanning electron microscope is used to evaluate the fracture mechanism and the micro-voids growth. A finite element model of uniaxial and biaxial tensile tests are developed, where a ductile damage model Gurson-Tvergaard-Needleman (GTN) is used to describe material deformation involving d'amage evolution. Comparison between the experimental and the simulation results show the accuracy of the finite element model to predict the instability phenomenon. The advanced measurement techniques contribute to understand better the ductile fracture mechanism.

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Document Information

Document Title Failure analysis based on microvoid growth for sheet metal during uniaxial and biaxial tensile tests
Author / Organization Fethi Abbassi, Sebastien Mistou, Ali Zghal
Subject & Discipline Multidisciplinary Academic Open Research
Categories Science & Mathematics
Publication Year 2013
License / Rights Open Access / Creative Commons
Resource Verification Listed PDF (Verification Pending)
Original Host Website HAL Open Science (hal.science)
File Format application/pdf (Portable Document Format)
Language EN
Catalog ID DOC-141435
Original Source Link Visit Source Page on hal.science »