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Generation-Recombination Defects In AlGaN/GaN HEMT On SiC Substrate, Evidenced By Low Frequency Noise Measurements And SIMS Characterization
Author / Organization: Jean-Guy Tartarin, Geoffroy Soubercaze-Pun, Jean-Laurent Grondin, Laurent Bary, Jaime Mimila-Arroyo, Jacques Chevallier
| File Format | PDF (Portable Document Format) |
|---|---|
| Publication Year | 2007 |
| Source Host |
HAL Open Science
(hal.science)
|
| License / Terms | Open Access / Creative Commons |
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