Passive device degradation models for a electromagnetic emission robustness study of a buck DC-DC converter
Overview & Synopsis
Past works showed that the degradation of the passive devices caused by aging could induce failures of electronic system, including a harmful evolution of electromagnetic compatibility. This paper presents the impact of accelerated aging conditions on several typical passive components (capacitor, inductor). The preliminary degradation models of electrolytic capacitor and powder iron inductor are proposed based on experimental results and physical analysis. The overall objective of this study is to predict the evolution of electromagnetic emission level produced by a buck DC-DC converter under a thermal aging, by using these passive device degradation models.
Indexed from repository: HAL Open Science
(
hal.science)
Keyboard Shortcuts:
← / → for pages • + / - for zoom • 0 to fit width
Powered by Mozilla PDF.js v3.11
Document Information
| Document Title | Passive device degradation models for a electromagnetic emission robustness study of a buck DC-DC converter |
|---|---|
| Author / Organization | He Huang, Alexandre Boyer, Sonia Ben Dhia |
| Subject & Discipline | Multidisciplinary Academic Open Research |
| Categories | Science & Mathematics |
| Publication Year | 2015 |
| License / Rights | Open Access / Creative Commons |
| Resource Verification | Listed PDF (Verification Pending) |
| Original Host Website |
HAL Open Science
(hal.science)
|
| File Format | application/pdf (Portable Document Format) |
| Language | EN |
| Catalog ID | DOC-133708 |
| Original Source Link | Visit Source Page on hal.science » |