X-ray phase-sensitive imaging using a bilens interferometer based on refractive optics

Overview & Synopsis

The phase-sensitive X-ray imaging technique based on the bilens interferometer is developed. The essence of the method consists of scanning a sample, which is set upstream of the bilens across the beam of one lens of the interferometer by recording changes in the interference pattern using a high-resolution image detector. The proposed approach allows acquiring the absolute value of a phase shift profile of the sample with a fairly high phase and spatial resolution. The possibilities of the imaging technique were studied theoretically and experimentally using fibres with different sizes as the test samples at the ESRF ID06 beamline with 12 keV X-rays. The corresponding phase shift profile reconstructions and computer simulations were performed. The experimental results are fully consistent with theoretical concepts and appropriate numerical calculations. Applications of the interferometric imaging technique are discussed, as well as future improvements. (C) 2020 Optical Society of America under the terms of the OSA Open Access Publishing Agreement