THICKNESS DETERMINATION OF THIN FILMS BY THE EVAPORATION METHOD. TECHNICAL COMMENT
Overview & Synopsis
Thickness determination of thin films by the evaporation method
Indexed from repository: NASA Technical Reports Server
(
ntrs.nasa.gov)
Document Information
| Document Title | THICKNESS DETERMINATION OF THIN FILMS BY THE EVAPORATION METHOD. TECHNICAL COMMENT |
|---|---|
| Author / Organization | Modisette, J. L. |
| Subject & Discipline | OTHER |
| Categories | Aerospace & Aviation |
| Publication Year | 2012 |
| License / Rights | Public Domain / NASA STI Open Access |
| Resource Verification | Listed PDF (Verification Pending) |
| Original Host Website |
NASA Technical Reports Server
(ntrs.nasa.gov)
|
| File Format | application/pdf (Portable Document Format) |
| Language | EN |
| Catalog ID | DOC-69008 |
| Original Source Link | Visit Source Page on ntrs.nasa.gov » |