Analog and Mixed Signal Circuits Testing
Overview & Synopsis
This note covers
the following topics: The place of testing in IC�s life cycle, Classification of
defects, The faults of the analog circuits, Testability measuring, The
approaches of analog circuit testing, Functional Diagnosis, DFT of Analog
Circuits, Built-In Self-Test, Analog-digital test bus.
Indexed from repository: FreeBookCentre
(
freebookcentre.net)
Document Information
| Document Title | Analog and Mixed Signal Circuits Testing |
|---|---|
| Author / Organization | Sergey G. Mosin |
| Categories | Analog Circuits |
| Resource Verification | Listed PDF (Verification Pending) |
| Original Host Website |
FreeBookCentre
(freebookcentre.net)
|
| File Format | application/pdf (Portable Document Format) |
| Page Count | 154 pages |
| Language | EN |
| Catalog ID | DOC-309397 |
| Original Source Link | Visit Source Page on freebookcentre.net » |