Coordinated EDX and micro‐Raman analysis of presolar silicon carbide: A novel, nondestructive method to identify rare subgroup SiC
Indexed from repository: NASA Technical Reports Server
(
ntrs.nasa.gov)
Document Information
| Document Title | Coordinated EDX and micro‐Raman analysis of presolar silicon carbide: A novel, nondestructive method to identify rare subgroup SiC |
|---|---|
| Author / Organization | Nan Liu, Andrew Steele, Larry R. Nittler, Rhonda M. Stroud, Bradley T. De Gregorio, Conel M. O'D. Alexander, Jianhua Wang |
| Subject & Discipline | REPRINT |
| Categories | Aerospace & Aviation |
| Publication Year | 2026 |
| License / Rights | Public Domain / NASA STI Open Access |
| Resource Verification | Listed PDF (Verification Pending) |
| Original Host Website |
NASA Technical Reports Server
(ntrs.nasa.gov)
|
| File Format | application/pdf (Portable Document Format) |
| Language | EN |
| Catalog ID | DOC-17375 |
| Original Source Link | Visit Source Page on ntrs.nasa.gov » |