Home » Authors » Patrice Y. Simard, Yann A. Le Cun, John S. Denker, Bernard Victorri

Patrice Y. Simard, Yann A. Le Cun, John S. Denker, Bernard Victorri

Public reference bibliography and cataloged PDF materials authored or published by Patrice Y. Simard, Yann A. Le Cun, John S. Denker, Bernard Victorri.

Found 1 document(s) Page 1 of 1

Transformation invariance in pattern recognition - tangent distance and tangent propagation

Year: 1998 • Source: hal.science • Listed PDF

In pattern recognition, statistical modeling, or regression, the amount of data is the most critical factor affecting the performance. If the amount of data and computational resources are near infinite, many algorithmes...