Home » Authors » Franc Novak, Anton Biasizzo, Yves Bertrand, Marie-Lise Flottes, Luz Balado, Joan Figueras, Stefano Di Carlo, Paolo Ernesto Prinetto, Nicoleta Pricoli, Hans-Joachim Wunderlich, Jean-Pierre van Der Heyden

Franc Novak, Anton Biasizzo, Yves Bertrand, Marie-Lise Flottes, Luz Balado, Joan Figueras, Stefano Di Carlo, Paolo Ernesto Prinetto, Nicoleta Pricoli, Hans-Joachim Wunderlich, Jean-Pierre van Der Heyden

Public reference bibliography and cataloged PDF materials authored or published by Franc Novak, Anton Biasizzo, Yves Bertrand, Marie-Lise Flottes, Luz Balado, Joan Figueras, Stefano Di Carlo, Paolo Ernesto Prinetto, Nicoleta Pricoli, Hans-Joachim Wunderlich, Jean-Pierre van Der Heyden.

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Academic Network for Microelectronic Test Education

Year: 2007 • Source: hal.science • Listed PDF

This paper is an overview of the activities performed in the framework of the European IST project EuNICE-Test (European Network for Initial and Continuing Education in VLSI/SOC Testing) using remote automatic test equip...