Home » Authors » Emmanuel Brousseau, Benoît Arnal, Stéphane Thiery, Eric Nyiri, Olivier Gibaru

Emmanuel Brousseau, Benoît Arnal, Stéphane Thiery, Eric Nyiri, Olivier Gibaru

Public reference bibliography and cataloged PDF materials authored or published by Emmanuel Brousseau, Benoît Arnal, Stéphane Thiery, Eric Nyiri, Olivier Gibaru.

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A simple and generic CAD/CAM approach for AFM probe-based machining

Year: 2015 • Source: hal.science • Listed PDF

Atomic Force Microscopy (AFM) probe-based machining allows surface structuring at the nano-scale via the mechanical modification of material. This results from the direct contact between the tip of an AFM probe and the s...