Home » Authors » C. Chauvet, F. Polack, M G Silly, B. Lagarde, M. Thomasset, S. Kubsky, J P Duval, P. Risterucci, B. Pilette, I. Yao, N. Bergeard, F. Sirotti

C. Chauvet, F. Polack, M G Silly, B. Lagarde, M. Thomasset, S. Kubsky, J P Duval, P. Risterucci, B. Pilette, I. Yao, N. Bergeard, F. Sirotti

Public reference bibliography and cataloged PDF materials authored or published by C. Chauvet, F. Polack, M G Silly, B. Lagarde, M. Thomasset, S. Kubsky, J P Duval, P. Risterucci, B. Pilette, I. Yao, N. Bergeard, F. Sirotti.

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Carbon contamination of soft X-ray beamlines: dramatic anti-reflection coating effects observed in the 1 keV photon energy region

Year: 2011 • Source: hal.science • Listed PDF

Carbon contamination is a general problem of under-vacuum optics submitted to high fluence. In soft X-ray beamlines carbon deposit on optics is known to absorb and scatter radiation close to the C K-edge (280 eV), forbid...